Please use this identifier to cite or link to this item: http://hdl.handle.net/20.500.14076/4145
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dc.contributor.authorMorán Meza, José Antonio-
dc.contributor.authorLubin, Christophe-
dc.contributor.authorThoyer, F.-
dc.contributor.authorVillegas Rosales, Kevin Amilcar-
dc.contributor.authorGutarra Espinoza, Abel Aurelio-
dc.contributor.authorMartin, F.-
dc.contributor.authorCousty, Jacques-
dc.creatorVillegas Rosales, Kevin Amilcar-
dc.date.accessioned2017-08-14T16:05:37Z-
dc.date.available2017-08-14T16:05:37Z-
dc.date.issued2015-05-
dc.identifier.issn0008-6223-
dc.identifier.urihttp://hdl.handle.net/20.500.14076/4145-
dc.description.abstractThe fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.es
dc.formatapplication/pdfes
dc.language.isoenges
dc.publisherElsevier Ltdes
dc.relation.urihttp://www.sciencedirect.com/science/article/pii/S0008622315000755es
dc.rightsinfo:eu-repo/semantics/restrictedAccesses
dc.rights.urihttp://creativecommons.org/licenses/by/4.0/es
dc.sourceUniversidad Nacional de Ingenieríaes
dc.sourceRepositorio Institucional - UNIes
dc.subjectCarbon fiber (CF)es
dc.subjectScanning Tunneling Microscopy (STM)es
dc.subjectFrequency modulation atomic force microscopy (FM-AFM)es
dc.titleFabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0001) surfacees
dc.typeinfo:eu-repo/semantics/articlees
dc.identifier.journalCarbones
dc.identifier.doi10.1016/j.carbon.2015.01.050es
dc.contributor.emailjmoranm@uni.edu.pees
dc.contributor.emailjacques.cousty@cea.fres
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